LOW-ENERGY ELECTRON-MICROSCOPY (LEEM)

被引：0
|
作者：
BAUER, E
MUNDSCHAU, M
SWIECH, W
TELIEPS, W
机构：
[1] TECH UNIV CLAUSTHAL,W-3392 CLAUSTHAL ZELLERFE,GERMANY
[2] SONDERFORSCH BEREICH 126,GOTTINGEN,GERMANY
来源：
ULTRAMICROSCOPY | 1990年 / 32卷 / 02期
关键词：
D O I：
暂无
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
引用
收藏
页码：188 / 188
页数：1
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