DEFECTS ON THE SURFACE OF MO(011) OBSERVED BY LOW-ENERGY ELECTRON-MICROSCOPY

被引：15
|
作者：
MUNDSCHAU, M
BAUER, E
SWIECH, W
机构：
[1] SONDERFORSCH BEREICH 126,D-3392 CLAUSTHAL ZELLERFE,FED REP GER
[2] WROCLAW B BEIRUT UNIV,INST EXPTL PHYS,UL CYBULSKIEGO 36,PL-50205 WROCLAW,POLAND
来源：
PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES | 1989年 / 59卷 / 02期
关键词：
D O I：
10.1080/01418618908205055
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：217 / 226
页数：10
相关论文
共 50 条
  • [1] INITIAL EPITAXIAL-GROWTH OF CU ON MO(011) BY LOW-ENERGY ELECTRON-MICROSCOPY AND PHOTOEMISSION ELECTRON-MICROSCOPY
    MUNDSCHAU, M
    BAUER, E
    SWIECH, W
    [J]. JOURNAL OF APPLIED PHYSICS, 1989, 65 (02) : 581 - 584
  • [2] LOW-ENERGY ELECTRON-MICROSCOPY OF SURFACE PROCESSES
    BAUER, E
    [J]. APPLIED SURFACE SCIENCE, 1992, 60-1 : 350 - 358
  • [3] Slip propagation in epitaxial Mo (011) studied by low-energy electron microscopy
    Mundschau, M
    Swiech, W
    Durfee, CS
    Flynn, CP
    [J]. SURFACE SCIENCE, 1999, 440 (1-2) : L831 - L834
  • [4] LOW-ENERGY ELECTRON-MICROSCOPY
    BAUER, E
    TELIEPS, W
    [J]. SCANNING MICROSCOPY, 1987, : 99 - 108
  • [5] LOW-ENERGY ELECTRON-MICROSCOPY
    BAUER, E
    MUNDSCHAU, M
    SWIECH, W
    TELIEPS, W
    [J]. EUREM 88, VOLS 1-3: TUTORIALS, INSTRUMENTATION AND TECHNIQUES / PHYSICS AND MATERIALS / BIOLOGY, 1988, 93 : 213 - 218
  • [6] LOW-ENERGY ELECTRON-MICROSCOPY
    BAUER, E
    MUNDSCHAU, M
    SWIECH, W
    TELIEPS, W
    [J]. INSTITUTE OF PHYSICS CONFERENCE SERIES, 1988, (93): : 213 - 218
  • [7] LOW-ENERGY ELECTRON-MICROSCOPY
    BAUER, E
    TELIEPS, W
    TURNER, G
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1988, 6 (03): : 573 - 574
  • [8] LOW-ENERGY ELECTRON-MICROSCOPY OF SURFACES
    TELIEPS, W
    BAUER, E
    [J]. SURFACE SCIENCE, 1988, 200 (2-3) : 512 - 513
  • [9] LOW-ENERGY ELECTRON-MICROSCOPY (LEEM)
    BAUER, E
    MUNDSCHAU, M
    SWIECH, W
    TELIEPS, W
    [J]. ULTRAMICROSCOPY, 1990, 32 (02) : 188 - 188
  • [10] SCANNING LOW-ENERGY ELECTRON-MICROSCOPY
    ICHINOKAWA, T
    ISHIKAWA, Y
    KEMMOCHI, M
    IKEDA, N
    HOSOKAWA, Y
    KIRSCHNER, J
    [J]. SCANNING MICROSCOPY, 1987, : 93 - 97
12345