APPLICATION OF GENERALIZED ELLIPSOMETRY TO ANISOTROPIC CRYSTALS

被引：57
|
作者：
AZZAM, RMA [1 ]
BASHARA, NM [1 ]
机构：
[1] UNIV NEBRASKA,DEPT ELECTR ENGN,ELECTR MAT LAB,LINCOLN,NB 68508
来源：
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA | 1974年 / 64卷 / 02期
关键词：
CALCITE - Optical Properties - CRYSTALS - Optical Properties - FILMS - Optical Properties;
D O I：
10.1364/JOSA.64.000128
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
Recent developments are reported on the use of basic ellipsometric techniques on anisotropic substrates and on anisotropic film-substrate systems. The method uses generalized ellipsometry, together with 4 multiplied by 4 matrix methods to study the reflection and transmission of polarized light by stratified anisotropic media. An example is given of an uniaxial crystal of calcite, where, from several null measurements at a single unknown orientation of the optic axis, the five optical parameters that characterize the crystal are all determined.
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收藏
页码：128 / 133
页数：6
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