APPLICATION OF GENERALIZED ELLIPSOMETRY TO ANISOTROPIC CRYSTALS

Recent developments are reported on the use of basic ellipsometric techniques on anisotropic substrates and on anisotropic film-substrate systems. The method uses generalized ellipsometry, together with 4 multiplied by 4 matrix methods to study the reflection and transmission of polarized light by stratified anisotropic media. An example is given of an uniaxial crystal of calcite, where, from several null measurements at a single unknown orientation of the optic axis, the five optical parameters that characterize the crystal are all determined.