LASER PULSED E-BEAM SYSTEM FOR HIGH-SPEED IC TESTING

被引：0
|
作者：
MAY, P [1 ]
HALBOUT, JM [1 ]
CHIU, G [1 ]
机构：
[1] IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
来源：
JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 1987年 / 134卷 / 03期
关键词：
D O I：
暂无
中图分类号：
O646 [电化学、电解、磁化学];
学科分类号：
081704 ;
摘要：
引用
收藏
页码：C116 / C116
页数：1
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