STRUCTURE OF CHEMICALLY DEPOSITED POLYCRYSTALLINE-SILICON FILMS

被引:99
|
作者
KAMINS, TI [1 ]
CASS, TR [1 ]
机构
[1] FAIRCHILD CAMERA & INSTR CORP,RES & DEV LAB,PALO ALTO,CA 94304
关键词
D O I
10.1016/0040-6090(73)90164-8
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
下载
收藏
页码:147 / 165
页数:19
相关论文
共 50 条
  • [41] INVERSION LAYER SOLAR-CELLS ON CHEMICALLY VAPOR-DEPOSITED POLYCRYSTALLINE SILICON THIN-FILMS
    BURTE, EP
    HEZEL, R
    JOURNAL OF APPLIED PHYSICS, 1984, 55 (04) : 1183 - 1187
  • [42] NUMERICAL-SIMULATION OF POLYCRYSTALLINE-SILICON MOSFETS
    GUERRIERI, R
    CIAMPOLINI, P
    GNUDI, A
    RUDAN, M
    BACCARANI, G
    PROCEEDINGS OF THE SID, 1986, 27 (03): : 217 - 222
  • [43] Mechanism of polycrystalline-silicon etching in a fluorocarbon plasma
    Cho, BO
    Hwang, SW
    Kim, IW
    Moon, SH
    PROCEEDINGS OF THE INTERNATIONAL SYMPOSIUM ON THIN FILM MATERIALS, PROCESSES, RELIABILITY, AND APPLICATIONS: THIN FILM PROCESSES, 1998, 97 (30): : 1 - 11
  • [44] Polycrystalline-silicon LPCVD by propene-assisted silane pyrolysis: A study of the process and the films
    Erkov, V.G.
    Devyatova, S.F.
    Mikroelektronika, 2002, 31 (05): : 335 - 344
  • [45] Impedance spectroscopy studies on chemically deposited CdS and PbS polycrystalline films
    Ortuño-López, MB
    Valenzuela-Jáuregui, JJ
    Ramírez-Bon, R
    Prokhorov, E
    González-Hernández, J
    JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 2002, 63 (04) : 665 - 668
  • [46] Polycrystalline-Silicon LPCVD by Propene-Assisted Silane Pyrolysis: A Study of the Process and the Films
    Erkov V.G.
    Devyatova S.F.
    Russian Microelectronics, 2002, 31 (5) : 282 - 289
  • [47] NUMERICAL-SIMULATION OF POLYCRYSTALLINE-SILICON MOSFETS
    GUERRIERI, R
    CIAMPOLINI, P
    GNUDI, A
    RUDAN, M
    BACCARANI, G
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1986, 33 (08) : 1201 - 1206
  • [48] Effects of mechanical stress on polycrystalline-silicon resistors
    Nakabayashi, M
    Ohyama, H
    Simoen, E
    Ikegami, M
    Claeys, C
    Kobayashi, K
    Yoneoka, M
    Miyahara, K
    THIN SOLID FILMS, 2002, 406 (1-2) : 195 - 199
  • [49] STRUCTURE TYPES IN POLYCRYSTALLINE SILICON FILMS
    KOBKA, VG
    NAKHODKIN, NG
    RODIONOVA, TV
    INORGANIC MATERIALS, 1988, 24 (02) : 251 - 252
  • [50] LEAKAGE CURRENT CHARACTERISTICS OF OFFSET-GATE-STRUCTURE POLYCRYSTALLINE-SILICON MOSFETS
    SEKI, S
    KOGURE, O
    TSUJIYAMA, B
    IEEE ELECTRON DEVICE LETTERS, 1987, 8 (09) : 434 - 436