LOW-ENERGY ELECTRON-DIFFRACTION INVESTIGATIONS OF SI MOLECULAR-BEAM EPITAXY ONTO SI(100)

被引:32
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HORN, M
GOTTER, U
HENZLER, M
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10.1116/1.584358
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TM [电工技术]; TN [电子技术、通信技术];
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0808 ; 0809 ;
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页码:727 / 730
页数:4
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