共 50 条
- [31] STEREOVISION IN A SCANNING ELECTRON-MICROSCOPE SOVIET JOURNAL OF OPTICAL TECHNOLOGY, 1979, 46 (08): : 449 - 452
- [32] PHOTOGRAMMETRY WITH SCANNING ELECTRON-MICROSCOPE JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1973, 6 (04): : 392 - 396
- [34] THE OPTICAL DIFFRACTION GRATING AS A REFERENCE GAUGE STRUCTURE FOR SCANNING ELECTRON-MICROSCOPE IZVESTIYA AKADEMII NAUK SERIYA FIZICHESKAYA, 1993, 57 (08): : 79 - 83
- [35] PHASE IDENTIFICATION USING BACKSCATTER KIKUCHI DIFFRACTION IN THE SCANNING ELECTRON-MICROSCOPE INSTITUTE OF PHYSICS CONFERENCE SERIES, 1990, (98): : 451 - 454
- [36] ROTATION BETWEEN MICROGRAPHS FROM SCANNING ELECTRON-MICROSCOPE AND ELECTRON CHANNELING PATTERNS JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1974, 7 (09): : 768 - 770
- [39] QUALITY OF TYPE-1 MAGNETIC CONTRAST OBTAINED IN SCANNING ELECTRON-MICROSCOPE PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1976, 36 (02): : 647 - 657
- [40] DIGITAL PROCESSING OF VLSI CIRCUIT IMAGES OBTAINED FROM A SCANNING ELECTRON-MICROSCOPE IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS, 1990, 37 (06): : 824 - 827