OBSERVATION OF SINGLE EVENT UPSETS IN ANALOG MICROCIRCUITS

被引：97
|
作者：
KOGA, R
PINKERTON, SD
MOSS, SC
MAYER, DC
LALUMONDIERE, S
HANSEL, SJ
CRAWFORD, KB
CRAIN, WR
机构：
[1] The Aerospace Corporation, Los Angeles, CA, 90009
来源：
IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1993年 / 40卷 / 06期
关键词：
D O I：
10.1109/23.273472
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Selected analog devices were tested for heavy ion induced single event upset (SEU). The results of these tests are presented, likely upset mechanisms are discussed, and standards for the characterization of analog upsets are suggested. The OP-15 operational amplifier, which was found to be susceptible to SEU lit the laboratory, has also experienced upset in space. Possible strategies for mitigating the occurrence of analog SEUs in space are discussed.
引用
收藏
页码：1838 / 1844
页数：7
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