OBSERVATION OF SINGLE EVENT UPSETS IN ANALOG MICROCIRCUITS

被引：97
|
作者：
KOGA, R
PINKERTON, SD
MOSS, SC
MAYER, DC
LALUMONDIERE, S
HANSEL, SJ
CRAWFORD, KB
CRAIN, WR
机构：
[1] The Aerospace Corporation, Los Angeles, CA, 90009
来源：
IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1993年 / 40卷 / 06期
关键词：
D O I：
10.1109/23.273472
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Selected analog devices were tested for heavy ion induced single event upset (SEU). The results of these tests are presented, likely upset mechanisms are discussed, and standards for the characterization of analog upsets are suggested. The OP-15 operational amplifier, which was found to be susceptible to SEU lit the laboratory, has also experienced upset in space. Possible strategies for mitigating the occurrence of analog SEUs in space are discussed.
引用
收藏
页码：1838 / 1844
页数：7
相关论文
共 50 条
  • [21] Accurate Analysis of Single Event Upsets in a Pipelined Microprocessor
    M. Rebaudengo
    M. Sonza Reorda
    M. Violante
    Journal of Electronic Testing, 2003, 19 : 577 - 584
  • [22] Design optimization for robustness to single-event upsets
    Zhou, Quming
    Choudhury, Mihir R.
    Mohanram, Kartik
    24TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS, 2006, : 202 - +
  • [23] NEUTRON GENERATED SINGLE-EVENT UPSETS IN THE ATMOSPHERE
    SILBERBERG, R
    TSAO, CH
    LETAW, JR
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1984, 31 (06) : 1183 - 1185
  • [24] NUCLEAR MICROPROBE IMAGING OF SINGLE-EVENT UPSETS
    HORN, KM
    DOYLE, BL
    SEXTON, FW
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1992, 39 (01) : 7 - 12
  • [25] Single Event Upsets and Hot Pixels in Digital Imagers
    Chapman, Glenn H.
    Thomas, Rahul
    Thomas, Rohan
    Meneses, Klinsmann J. Coelho Silva
    Yang, Tommy Q.
    Koren, Israel
    Koren, Zahava
    PROCEEDINGS OF THE 2015 IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI AND NANOTECHNOLOGY SYSTEMS (DFTS), 2015, : 41 - 46
  • [26] PREDICTING SINGLE EVENT UPSETS IN THE EARTHS PROTON BELTS
    BENDEL, WL
    PETERSEN, EL
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1984, 31 (06) : 1201 - 1206
  • [27] Accurate analysis of single event upsets in a pipelined microprocessor
    Rebaudengo, M
    Reorda, MS
    Violante, M
    JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2003, 19 (05): : 577 - 584
  • [28] MODELING CHARGE COLLECTION AND SINGLE EVENT UPSETS IN MICROELECTRONICS
    MCNULTY, PJ
    ABDELKADER, WG
    LYNCH, JE
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1991, 61 (01): : 52 - 60
  • [29] Single event upsets in the ATLAS IBL frontend ASICs
    Takubo, Y.
    JOURNAL OF INSTRUMENTATION, 2019, 14
  • [30] Impact of Process Variations on SRAM Single Event Upsets
    Kauppila, A. V.
    Bhuva, Bharat L.
    Kauppila, J. S.
    Massengill, Lloyd W.
    Holman, W. T.
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2011, 58 (03) : 834 - 839
12345