PIEZOELECTRIC DETECTION OF SIGNALS IN SCANNING ELECTRON ACOUSTIC MICROSCOPY

被引：0
|
作者：
QIAN, MG
CANTRELL, JH
ROCCA, FJ
机构：
来源：
PROCEEDINGS : INSTITUTE OF ACOUSTICS, VOL 11, PART 5: ACOUSTICS 89 | 1989年 / 11卷
关键词：
D O I：
暂无
中图分类号：
O42 [声学];
学科分类号：
070206 ; 082403 ;
摘要：
引用
收藏
页码：453 / 460
页数：8
相关论文
共 50 条
  • [1] Piezoelectric coupling effect of ferroelectrics in scanning electron acoustic microscopy
    Zhang, BY
    Yin, QR
    [J]. 9TH INTERNATIONAL CONFERENCE ON PHOTOACOUSTIC AND PHOTOTHERMAL PHENOMENA, CONFERENCE DIGEST, 1996, : 243 - 244
  • [2] SCANNING ELECTRON ACOUSTIC MICROSCOPY AND SCANNING ACOUSTIC MICROSCOPY - A FAVORABLE COMPARISON
    BRIGGS, GAD
    [J]. SCANNING ELECTRON MICROSCOPY, 1984, : 1041 - 1052
  • [3] SCANNING ELECTRON ACOUSTIC MICROSCOPY
    DAVIES, G
    HOWIE, A
    STAVELEYSMITH, L
    [J]. PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS, 1983, 368 : 58 - 65
  • [4] SCANNING ELECTRON ACOUSTIC MICROSCOPY
    DAVIES, DG
    [J]. SCANNING ELECTRON MICROSCOPY, 1983, : 1163 - 1176
  • [5] SCANNING ELECTRON ACOUSTIC MICROSCOPY
    BALK, LJ
    [J]. ADVANCES IN ELECTRONICS AND ELECTRON PHYSICS, 1988, 71 : 1 - 73
  • [6] Use of scanning electron microscopy in the detection of flaws in piezoelectric and ferroelectric crystals
    Roshchupkin, DV
    Tkachev, SV
    [J]. INDUSTRIAL LABORATORY, 1996, 62 (08): : 501 - 503
  • [7] APPLICATIONS OF SCANNING ELECTRON ACOUSTIC MICROSCOPY
    DAVIES, DG
    HOWIE, A
    [J]. INSTITUTE OF PHYSICS CONFERENCE SERIES, 1983, (68): : 467 - 470
  • [8] TECHNIQUES FOR SCANNING ELECTRON ACOUSTIC MICROSCOPY
    BALK, LJ
    KULTSCHER, N
    [J]. INSTITUTE OF PHYSICS CONFERENCE SERIES, 1983, (67): : 387 - 392
  • [9] QUANTITATIVE SCANNING ELECTRON ACOUSTIC MICROSCOPY OF SILICON
    DOMNIK, M
    BALK, LJ
    [J]. SCANNING MICROSCOPY, 1993, 7 (01) : 37 - 48
  • [10] SCANNING ELECTRON ACOUSTIC MICROSCOPY OF ZNO CERAMICS
    FERNANDEZ, P
    LLOPIS, J
    PIQUERAS, J
    [J]. MATERIALS CHEMISTRY AND PHYSICS, 1989, 24 (1-2) : 215 - 218
12345