SEMICONDUCTOR IMPURITY MEASUREMENTS USING FOURIER-TRANSFORM INFRARED-SPECTROSCOPY

被引：0
|
作者：
KRISHNAN, K [1 ]
CHIHA, P [1 ]
机构：
[1] DIGILAB,CAMBRIDGE,MA 02139
来源：
JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 1980年 / 127卷 / 03期
关键词：
D O I：
暂无
中图分类号：
O646 [电化学、电解、磁化学];
学科分类号：
081704 ;
摘要：
引用
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页码：C98 / C98
页数：1
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