INVERSION LAYER FORMATION AND SURFACE-STATES AT THE GAAS-ELECTROLYTE INTERFACE

被引：0
|
作者：
BOSE, DN
SENGUPTA, U
ACHARYA, HN
机构：
来源：
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1979年 / 54卷 / 02期
关键词：
D O I：
10.1002/pssa.2210540261
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：K155 / K157
页数：3
相关论文
共 50 条
  • [31] SURFACE-STATES IN GAAS TUNNEL MIS STRUCTURES
    HIROSE, M
    YOKOYAMA, S
    OSAKA, Y
    [J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1977, 42 (02): : 483 - 488
  • [32] DIMINUTION OF THE SURFACE-STATES ON GAAS BY A SULFUR TREATMENT
    OH, YT
    BYUN, SC
    LEE, BR
    KANG, TW
    HONG, CY
    PARK, SB
    LEE, HK
    KIM, TW
    [J]. JOURNAL OF APPLIED PHYSICS, 1994, 76 (03) : 1959 - 1961
  • [33] THE INTERACTION OF HYDROGEN WITH SURFACE-STATES ON GAAS(100)
    BRINGANS, RD
    BACHRACH, RZ
    [J]. PHYSICA B & C, 1983, 117 (MAR): : 854 - 856
  • [34] FORMATION OF SURFACE-STATES ON THE (111) SURFACE OF DIAMOND
    PATE, BB
    STEFAN, PM
    BINNS, C
    JUPITER, PJ
    SHEK, ML
    LINDAU, I
    SPICER, WE
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1981, 19 (03): : 349 - 354
  • [35] ELECTRONIC SURFACE-STATES AT THE IRREGULAR INTERFACE OF MEDIA
    POGREBNYAK, VA
    YAKOVENKO, VM
    YAKOVENKO, IV
    [J]. PHYSICS LETTERS A, 1995, 209 (1-2) : 103 - 106
  • [36] SURFACE-STATES AT SILICON-POLYMER INTERFACE
    CHYBICKI, M
    [J]. ACTA PHYSICA POLONICA A, 1977, 51 (01) : 149 - 153
  • [37] INVERSION LAYER FORMATION AND ELECTROLUMINESCENCE AT PARA-GAAS/PERSULFATE SOLUTION INTERFACE
    UOSAKI, K
    KITA, H
    [J]. JOURNAL OF LUMINESCENCE, 1984, 31-2 (DEC) : 972 - 974
  • [38] CHARACTERIZATION OF SURFACE-STATES AT THE INP LIQUID INTERFACE
    GOODMAN, C
    [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1985, 132 (01) : C5 - C8
  • [39] REDOX REACTIONS AT GERMANIUM-ELECTROLYTE INTERFACE INVOLVING GE-RADICALS AS SURFACE-STATES
    SCHULTE, HD
    [J]. BERICHTE DER BUNSEN-GESELLSCHAFT-PHYSICAL CHEMISTRY CHEMICAL PHYSICS, 1977, 81 (03): : 276 - 281
  • [40] SURFACE-STATES AT THE NORMAL-GAAS-SIO2 INTERFACE FROM CONDUCTANCE AND CAPACITANCE MEASUREMENTS
    STREEVER, RL
    BRESLIN, JT
    AHLSTROM, EH
    [J]. SOLID-STATE ELECTRONICS, 1980, 23 (08) : 863 - 868
12345