DEEP IMPURITY CENTERS IN CDS SINGLE-CRYSTALS STUDIED BY SPECTRAL-ANALYSIS OF DEEP-LEVEL TRANSIENT SPECTROSCOPY

被引:2
|
作者
YOSHINO, J
TANAKA, K
OKAMOTO, Y
MORIMOTO, J
MIYAKAWA, T
机构
[1] Department of Materials Science and Engineering, National Defense Academy
关键词
DLTS; CDS; DEEP LEVEL; EMISSION RATE SPECTRUM; WAVE-FORM ANALYSIS; SOLAR CELL;
D O I
10.1143/JJAP.33.3480
中图分类号
O59 [应用物理学];
学科分类号
摘要
Deep impurity centers in CdS single crystals a ere studied by using spectral analysis of deep level transient spectroscopy (SADLTS) to obtain the emission rate spectrum. We found one deep level below the conduction band with the activation energy and the capture cross section distributed around their central values E(0)=0.31 eV and sigma(0)=4.0 x 10(-16) cm(2) over widths Delta E=0.013 and Delta sigma= 9.3 x 10(-17) cm(2), respectively.
引用
收藏
页码:3480 / 3481
页数:2
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