共 50 条
- [1] DETERMINATION OF CARRIER MOBILITY IN A SURFACE-LAYER OF A SEMICONDUCTOR FROM AMPLIFICATION OF ELASTIC SURFACE-WAVES [J]. SOVIET PHYSICS SEMICONDUCTORS-USSR, 1974, 8 (06): : 771 - 772
- [2] DETERMINATION OF COMPLETE CARRIER DENSITY AND DRIFT MOBILITY PROFILES IN THIN SEMICONDUCTOR LAYERS [J]. IEE JOURNAL ON SOLID-STATE AND ELECTRON DEVICES, 1979, 3 (02): : 29 - 32
- [4] CONTACTLESS DETERMINATION OF FREE CARRIER DENSITY AND MOBILITY IN SEMICONDUCTORS [J]. SOVIET PHYSICS SEMICONDUCTORS-USSR, 1988, 22 (09): : 1060 - 1062
- [6] INVERSION LAYER CARRIER MOBILITY IN METAL-OXIDE-SEMICONDUCTOR DEVICES [J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1980, 57 (02): : 683 - 690
- [7] DETERMINATION OF THE CARRIER MOBILITY AND DENSITY IN SEMICONDUCTORS BY CONTACTLESS MAGNETOPLASMA METHODS [J]. SOVIET PHYSICS SEMICONDUCTORS-USSR, 1980, 14 (06): : 705 - 710
- [8] PHOTOCONDUCTIVE STUDIES OF CARRIER MOBILITY ACROSS SEMICONDUCTOR SURFACE DEPLETION ZONES [J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1994, 146 (02): : K9 - K11
- [9] NONEQUILIBRIUM CARRIER DENSITY DEPENDENCE OF RATE OF RECOMBINATION AT SURFACE OF A SEMICONDUCTOR [J]. SOVIET PHYSICS SEMICONDUCTORS-USSR, 1969, 2 (09): : 1035 - +
- [10] CARRIER DENSITY IN LAYER STRUCTURES OF MICROELECTRONICS - A MODIFIED LOCAL DENSITY APPROXIMATION FOR SEMICONDUCTOR LAYERS [J]. PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 1986, 135 (02): : 783 - 793