DETERMINATION OF COMPLETE CARRIER DENSITY AND DRIFT MOBILITY PROFILES IN THIN SEMICONDUCTOR LAYERS

被引：0

|

作者：

HUANG, RS

LADBROOKE, PH

机构：

来源：

IEE JOURNAL ON SOLID-STATE AND ELECTRON DEVICES | 1979年 / 3卷 / 02期

关键词：

Compendex;

D O I：

10.1049/ij-ssed.1979.0009

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

SEMICONDUCTOR MATERIALS

引用

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页码：29 / 32

页数：4

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