SILICON SEMICONDUCTOR-DETECTORS IN PROBLEMS OF RADIOMETRIC INSPECTION

被引：0

作者：

VALEVICH, MI

机构：

来源：

SOVIET JOURNAL OF NONDESTRUCTIVE TESTING-USSR | 1979年 / 15卷 / 05期

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暂无

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：452 / 454

页数：3

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