A THEORETICAL DERIVATION OF THE LOG-NORMAL DISTRIBUTION OF TIME-DEPENDENT DIELECTRIC-BREAKDOWN IN THIN OXIDES

被引：3
|
作者：
YAW, Y [1 ]
MULLER, RS [1 ]
机构：
[1] UNIV CALIF BERKELEY,DEPT ELECT ENGN & COMP SCI,ELECTR RES LAB,BERKELEY,CA 94720
来源：
SOLID-STATE ELECTRONICS | 1989年 / 32卷 / 07期
关键词：
D O I：
10.1016/0038-1101(89)90110-X
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：541 / 546
页数：6
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