A THEORETICAL DERIVATION OF THE LOG-NORMAL DISTRIBUTION OF TIME-DEPENDENT DIELECTRIC-BREAKDOWN IN THIN OXIDES

被引：3

作者：

YAW, Y ^{[1
]}

MULLER, RS ^{[1
]}

机构：

[1] UNIV CALIF BERKELEY,DEPT ELECT ENGN & COMP SCI,ELECTR RES LAB,BERKELEY,CA 94720

来源：

SOLID-STATE ELECTRONICS | 1989年 / 32卷 / 07期

关键词：

D O I：

10.1016/0038-1101(89)90110-X

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：541 / 546

页数：6

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