STRUCTURE AND PROPERTIES OF RF SPUTTERED, SUPERCONDUCTING TANTALUM FILMS

被引:18
|
作者
SCHREY, F
MATHIS, RD
PAYNE, RT
MURR, LE
机构
关键词
D O I
10.1016/0040-6090(70)90048-9
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:29 / &
相关论文
共 50 条
  • [31] EFFECTS OF ARGON PRESSURE ON PROPERTIES OF SPUTTERED TANTALUM FILMS
    WESTWOOD, WD
    BOYNTON, RJ
    WILCOX, PS
    THIN SOLID FILMS, 1973, 16 (01) : 1 - 25
  • [32] Effect of RF power on Structure and Optical Properties of RF sputtered Copper Oxide Thin Films
    Kaur, Jasmeet
    Saipriya, S.
    Singh, R.
    PROCEEDINGS OF THE 59TH DAE SOLID STATE PHYSICS SYMPOSIUM 2014 (SOLID STATE PHYSICS), 2015, 1665
  • [33] STRUCTURE-RELATED CONDUCTION PROPERTIES OF SPUTTERED NITROGEN-DOPED TANTALUM FILMS
    BRIONES, F
    GOLMAYO, D
    THIN SOLID FILMS, 1979, 57 (02) : 332 - 332
  • [34] PROPERTIES OF SUPERCONDUCTING VANADIUM NITRIDE SPUTTERED FILMS
    ZASADZINSKI, J
    VAGLIO, R
    RUBINO, G
    GRAY, KE
    RUSSO, M
    PHYSICAL REVIEW B, 1985, 32 (05): : 2929 - 2934
  • [35] SUPERCONDUCTING PROPERTIES AND STRUCTURE OF REACTIVELY SPUTTERED NIOBIUM CARBIDE THIN-FILMS
    SPITZER, HJ
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1973, 10 (01): : 20 - 21
  • [36] Influence of RF power on structure and electrical properties of sputtered SrHfON thin films
    Feng, Li-ping
    Liu, Zheng-tang
    Tian, Hao
    Liu, Lu
    MATERIALS LETTERS, 2012, 78 : 66 - 68
  • [37] STRUCTURE-SENSITIVE MAGNETIC-PROPERTIES OF RF SPUTTERED NIFE FILMS
    CARGILL, GS
    HERD, SR
    KRULL, WE
    AHN, KY
    IEEE TRANSACTIONS ON MAGNETICS, 1979, 15 (06) : 1821 - 1823
  • [38] The structure and photoluminescence properties of RF-sputtered films of ZnO on Teflon substrate
    Liu, Yun-yan
    Yuan, Yu-zhen
    Li, Cheng-feng
    Gao, Xu-tuan
    Cao, Xin-zhong
    Li, Jiang-bo
    MATERIALS LETTERS, 2008, 62 (17-18) : 2907 - 2909
  • [39] Microstructure and thermal diffusivity investigations of RF-sputtered tantalum nitride films
    Jong, CA
    Gan, JY
    Chin, TS
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2002, 41 (08): : 5367 - 5371
  • [40] Microstructure and thermal diffusivity investigations of RF-sputtered tantalum nitride films
    Jong, Chao-An
    Gan, Jon-Yiew
    Chin, Tsung-Shune
    Chin, T.-S. (tschin@mse.nthu.edu.tw), 1600, Japan Society of Applied Physics (41): : 5367 - 5371