FIELD-STRENGTH MEASUREMENTS OF MICROWAVE-OVEN LEAKAGE AT 915 MHZ

被引：1

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作者：

TELL, RA

机构：

来源：

IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY | 1978年 / 20卷 / 02期

关键词：

D O I：

10.1109/TEMC.1978.303612

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

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页码：341 / 346

页数：6

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