CHARACTERIZATION OF VANADIUM-OXIDE OPTICAL THIN-FILMS BY X-RAY-DIFFRACTOMETRY

被引：6

作者：

CHAIN, EE ^{[1
]}

机构：

[1] LTV, MISSILES & ELECTR GRP, DIV MISSILES, DALLAS, TX 75265 USA

来源：

APPLIED OPTICS | 1989年 / 28卷 / 04期

关键词：

D O I：

10.1364/AO.28.000713

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：713 / 716

页数：4

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