PHASE DETERMINATION AND COMPENSATION OF LENS ABERRATIONS IN ELECTRON-MICROSCOPY - CLARIFICATION OF A PROBLEM

被引：0
|
作者：
FRANK, J [1 ]
机构：
[1] UNIV CAMBRIDGE,CAVENDISH LAB,FREE SCH LANE,CAMBRIDGE CB2 3RQ,ENGLAND
来源：
OPTIK | 1974年 / 41卷 / 01期
关键词：
D O I：
暂无
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
引用
收藏
页码：90 / 91
页数：2
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