PHASE DETERMINATION AND COMPENSATION OF LENS ABERRATIONS IN ELECTRON-MICROSCOPY - CLARIFICATION OF A PROBLEM

被引：0

作者：

FRANK, J ^{[1
]}

机构：

[1] UNIV CAMBRIDGE,CAVENDISH LAB,FREE SCH LANE,CAMBRIDGE CB2 3RQ,ENGLAND

来源：

OPTIK | 1974年 / 41卷 / 01期

关键词：

D O I：

暂无

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：90 / 91

页数：2

共 50 条

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