PHASE DETERMINATION AND COMPENSATION OF LENS ABERRATIONS IN ELECTRON-MICROSCOPY - CLARIFICATION OF A PROBLEM

被引：0
|
作者：
FRANK, J [1 ]
机构：
[1] UNIV CAMBRIDGE,CAVENDISH LAB,FREE SCH LANE,CAMBRIDGE CB2 3RQ,ENGLAND
来源：
OPTIK | 1974年 / 41卷 / 01期
关键词：
D O I：
暂无
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
引用
收藏
页码：90 / 91
页数：2
相关论文
共 50 条
  • [1] REMARK ON PHASE DETERMINATION IN ELECTRON-MICROSCOPY
    FRANK, J
    OPTIK, 1973, 38 (05): : 582 - 584
  • [2] PHASE RECONSTRUCTION PROBLEM IN LIGHT AND ELECTRON-MICROSCOPY
    FERWERDA, HA
    HOENDERS, BJ
    HUISER, AMJ
    VANTOORN, P
    PHOTOGRAPHIC SCIENCE AND ENGINEERING, 1977, 21 (05): : 282 - 289
  • [3] Compensation of the Phase Aberrations in Digital Holographic Microscopy Based on Reference Lens Method
    Zeng Ya-nan
    Lei Hai
    Liu Yuan
    Hu Xiao-dong
    Zhu Rui
    Su Kang-yan
    ACTA PHOTONICA SINICA, 2018, 47 (01)
  • [4] COMMENT ON A METHOD FOR SOLUTION OF PHASE PROBLEM IN ELECTRON-MICROSCOPY
    GERCHBERG, RW
    SAXTON, WO
    JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1973, 6 (05) : L31 - L32
  • [5] DETERMINATION OF PHASE-DIAGRAMS BY ANALYTICAL ELECTRON-MICROSCOPY
    AYER, R
    JOURNAL OF METALS, 1987, 39 (07): : A29 - A29
  • [6] DEVICE OF ELECTROSTATIC LENS FOR ELECTRON-MICROSCOPY
    YAMAGUCHI, S
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1978, 125 (07) : 1191 - 1192
  • [7] ELECTRON-MICROSCOPY OF RABBIT LENS NUCLEOLI
    SRINIVASAN, BD
    IWAMOTO, T
    EXPERIMENTAL EYE RESEARCH, 1973, 16 (01) : 9 - 18
  • [8] SCANNING ELECTRON-MICROSCOPY OF THE FROG LENS
    KUSZAK, JR
    RAE, JL
    EXPERIMENTAL EYE RESEARCH, 1982, 35 (05) : 499 - 519
  • [9] OBSERVATION OF LENS ABERRATIONS FOR VERY HIGH-RESOLUTION ELECTRON-MICROSCOPY .1. THEORY
    SAXTON, WO
    JOURNAL OF MICROSCOPY-OXFORD, 1995, 179 : 201 - 213
  • [10] COMPENSATION FOR LENS ABERRATIONS IN ELECTRON-MICROSCOPIC HOLOGRAPHY
    MIRANDE, W
    MIKROSKOPIE, 1973, 28 (11-1) : 366 - 367
12345