DEPTH CONTROLLED EXAFS AND NEAR EDGE SPECTROSCOPY TO STUDY SURFACE LAYER STRUCTURE

被引：4
|
作者：
Thornley, F. R. [1 ]
Antonini, G. M. [2 ,3 ]
Greaves, G. N. [4 ]
Barrett, N. T. [5 ]
机构：
[1] Univ Strathclyde, Dept Appl Phys, Glasgow G4 ONG, Lanark, Scotland
[2] Univ Modena, CNSM, I-41100 Modena, Italy
[3] Univ Modena, Dept Phys, I-41100 Modena, Italy
[4] SERC, Daresbury Lab, Warrington WA4 4AD, Cheshire, England
[5] JRC, Div Phys, I-21020 Ispra, VA, Italy
来源：
JOURNAL DE PHYSIQUE | 1986年 / 47卷 / C-8期
关键词：
D O I：
10.1051/jphyscol:19868171
中图分类号：
学科分类号：
摘要：
Calculated and experimental intensity values are presented and compared for EXAFS spectrometry at grazing incidence with fluorescence or reflectivity detection, and samples in the form of single or double metal films evaporated onto flat glass substrates.
引用
收藏
页码：350 / 353
页数：4
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