Study of spot field near the edge of a nanofacet on a crystal surface by scanning tunnelling microscopy and spectroscopy

被引：0

作者：

Russian Acad of Sciences, Ryazan, Russia ^{[1
]}

机构：

来源：

Surface Investigation X-Ray, Synchrotron and Neutron Techniques | 2000年 / 15卷 / 07期

关键词：

Carrier concentration - Crystal structure - Graphite - Nanostructured materials - Scanning tunneling microscopy - Spectroscopic analysis - Stresses - Tungsten;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

The results of STM and STS investigations of graphite and tungsten crystals are presented. It has been shown that the investigation of the electron density distribution makes it possible to reveal elastic stresses of an opposite polarity on the facet edge.

引用

页码：1059 / 1063

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