Surface orientation of main and side chains of polyimide alignment layer studied by near-edge X-ray absorption fine structure spectroscopy

被引:28
|
作者
Sakai, T
Ishikawa, K
Takezoe, H [1 ]
Matsuie, N
Yamamoto, Y
Ishii, H
Ouchi, Y
Oji, H
Seki, K
机构
[1] Tokyo Inst Technol, Dept Organ & Polymer Mat, Meguro Ku, Tokyo 1588552, Japan
[2] Nagoya Univ, Grad Sch Sci, Dept Chem, Chikusa Ku, Nagoya, Aichi 4648602, Japan
[3] Inst Mol Sci, Dept Vacuum UV Photosci, Okazaki, Aichi 4448585, Japan
[4] Nagoya Univ, Res Ctr Mat Sci, Chigusa Ku, Nagoya, Aichi 4648602, Japan
来源
JOURNAL OF PHYSICAL CHEMISTRY B | 2001年 / 105卷 / 38期
关键词
D O I
10.1021/jp010482g
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The average near-surface orientation of the main and side chains of polyimide (Pl) for liquid crystal (L-C) alignment has been studied by near-edge X-ray absorption fine structure (NEXAFS) spectroscopy. A detailed analysis of the angular dependences of resonance intensities revealed that rubbing causes the inclination of the main chain with respect to the surface, the angle of which decreases with increasing rubbing strength. This variation was found to agree with the decrease of the LC pretilt angle in the cell fabricated with this PI surface. The relation between the surface tilt of the main chain and the pretilt of LC is almost the same for PI films with side chains. Thus, it is concluded that the main chain alignment is strongly correlated with the pretilt angle even in the side-chain PI alignment layer.
引用
收藏
页码:9191 / 9195
页数:5
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