PROTECTION OF SEMICONDUCTOR PHOTO-ANODES WITH ELECTRODEPOSITED METAL-OXIDE FILMS

被引：0

作者：

TENCH, D ^{[1
]}

WARREN, LF ^{[1
]}

机构：

[1] ROCKWELL INT,MICROELECTR RES & DEV CTR,THOUSAND OAKS,CA 91360

来源：

JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 1982年 / 129卷 / 03期

关键词：

D O I：

暂无

中图分类号：

O646 [电化学、电解、磁化学];

学科分类号：

081704 ;

摘要：

引用

页码：C114 / C114

页数：1

共 50 条

[31] EFFECTS OF ELECTRON IRRADIATION ON METAL-OXIDE SEMICONDUCTOR TRANSISTORS
STANLEY, AG
PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1965, 53 (06): : 627 - &
[32] Development of metal-oxide semiconductor odor sensors and their applications
Takada, T
Fukui, K
Suzuki, K
Saito, T
Shiozawa, H
Ehara, K
ELECTROCHEMISTRY, 1999, 67 (07) : 802 - 802
[33] A COMPARISON OF METAL-OXIDE SEMICONDUCTOR AND CATALYTIC GAS SENSORS
GENTRY, SJ
JONES, TA
SENSORS AND ACTUATORS, 1983, 4 (04): : 581 - 586
[34] Metal-oxide Semiconductor Nanostructures for Energy and Sensing Applications
Yu, Jae Su
Ko, Yeong Hwan
OXIDE-BASED MATERIALS AND DEVICES V, 2014, 8987
[35] COMPLEMENTARY METAL-OXIDE SEMICONDUCTOR LOGIC TESTABILITY.
Curtis, H.W.
IBM Technical Disclosure Bulletin, 1973, 16 (02): : 404 - 405
[36] METAL-OXIDE SEMICONDUCTOR INTEGRATED-CIRCUIT TECHNOLOGY
GRANNEMANN, WW
SOUTHWARD, HD
PHILLIPS, DH
ERTEZA, A
JOURNAL OF SCIENTIFIC & INDUSTRIAL RESEARCH, 1972, 31 (06): : 299 - +
[37] Surface Treatments on the Characteristics of Metal-Oxide Semiconductor Capacitors
Horng, Ray-Hua
Tseng, Ming-Chun
Wuu, Dong-Sing
CRYSTALS, 2019, 9 (01):
[38] COMPLEMENTARY METAL-OXIDE SEMICONDUCTOR CIRCUITS - NEW PROSPECTIVES
FULLAGAR, D
ELETTROTECNICA, 1981, 68 (09): : 779 - 783
[39] OPTIMIZATION OF A SAW METAL-OXIDE SEMICONDUCTOR GAS SENSOR
FALCONER, RS
LEC, R
VETELINO, JF
XU, Z
IEEE 1989 ULTRASONICS SYMPOSIUM : PROCEEDINGS, VOLS 1 AND 2, 1989, : 585 - 590
[40] SPECIAL SECTION ON METAL-OXIDE FILMS - FOREWORD
INAM, A
SANDS, TD
JOURNAL OF ELECTRONIC MATERIALS, 1992, 21 (05) : 473 - 473

← 1 2 3 4 5 →