COMPLEX PERMITTIVITY MEASUREMENT OF MIC SUBSTRATE

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作者：

GUILLON, P

GARAULT, Y

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来源：

AEU-ARCHIV FUR ELEKTRONIK UND UBERTRAGUNGSTECHNIK-INTERNATIONAL JOURNAL OF ELECTRONICS AND COMMUNICATIONS | 1981年 / 35卷 / 03期

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TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

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页码：102 / 104

页数：3

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