COMPLEX PERMITTIVITY MEASUREMENT OF MIC SUBSTRATE

被引：0
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作者：
GUILLON, P
GARAULT, Y
机构：
来源：
AEU-ARCHIV FUR ELEKTRONIK UND UBERTRAGUNGSTECHNIK-INTERNATIONAL JOURNAL OF ELECTRONICS AND COMMUNICATIONS | 1981年 / 35卷 / 03期
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TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
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页码：102 / 104
页数：3
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