ION-INDUCED AUGER-ELECTRON SPECTROSCOPY - NEW DETECTION METHOD FOR COMPOSITIONAL HOMOGENEITIES OF ALLOYED ATOMS IN SILICON

被引：1
|
作者：
HIRAKI, A
IMURA, T
IWAMI, M
KIM, SC
USHITA, K
OKAMOTO, H
HAMAKAWA, Y
机构：
来源：
SOLAR ENERGY MATERIALS | 1979年 / 2卷 / 01期
关键词：
D O I：
10.1016/0165-1633(79)90035-2
中图分类号：
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号：
0807 ; 0820 ;
摘要：
引用
收藏
页码：125 / 130
页数：6
相关论文
共 49 条
  • [1] ION-INDUCED AUGER-ELECTRON SPECTROSCOPY OF MG, AL AND SI
    NAUMKIN, AV
    IZVESTIYA AKADEMII NAUK SSSR SERIYA FIZICHESKAYA, 1991, 55 (12): : 2344 - 2348
  • [2] THE EFFECT OF CHANNELING ON MEV ION-INDUCED AUGER-ELECTRON PRODUCTION IN SILICON
    MACDONALD, JR
    FELDMAN, LC
    SILVERMAN, PJ
    DAVIES, JA
    JACKMAN, TE
    SURFACE SCIENCE, 1985, 157 (01) : L335 - L344
  • [3] SURFACE SENSITIVITY OF ION-INDUCED AUGER-ELECTRON EMISSION (IAE) SPECTROSCOPY
    VERUCCHI, R
    ALTIERI, S
    VALERI, S
    SURFACE SCIENCE, 1995, 331 : 1256 - 1261
  • [4] ION-INDUCED AUGER-ELECTRON STUDIES ON AL(110)
    WONG, L
    ALKEMADE, PFA
    LENNARD, WN
    MITCHELL, IV
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1990, 45 (1-4): : 637 - 640
  • [5] ION-INDUCED AUGER-ELECTRON EMISSION FROM ALUMINUM
    BARAGIOLA, RA
    ALONSO, EV
    RAITI, HJL
    PHYSICAL REVIEW A, 1982, 25 (04): : 1969 - 1976
  • [6] ION-INDUCED AUGER-ELECTRON EMISSION FROM SI SURFACE
    SAIKI, K
    TANAKA, S
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1982, 21 (09): : L529 - L531
  • [7] ORIGIN OF ION-INDUCED AUGER-ELECTRON EMISSION FROM METALS
    VIARISDELESEGNO, P
    RIVAIS, G
    HENNEQUIN, JF
    PHYSICS LETTERS A, 1974, A 49 (03) : 265 - 266
  • [8] PRINCIPLES AND APPLICATIONS OF ION-INDUCED AUGER-ELECTRON EMISSION FROM SOLIDS
    BARAGIOLA, RA
    RADIATION EFFECTS AND DEFECTS IN SOLIDS, 1982, 61 (1-2): : 47 - 72
  • [9] A SIMS INSTRUMENT WITH ELECTRON AND ION INDUCED AUGER-ELECTRON DETECTION
    MAYDELL, EA
    BOLOURI, H
    FABIAN, DJ
    MEASUREMENT SCIENCE AND TECHNOLOGY, 1992, 3 (11) : 1087 - 1094
  • [10] HYDROGEN DETECTION IN HYDROGENATED AMORPHOUS-SILICON BY ION-INDUCED AUGER-SPECTROSCOPY
    HIRATA, GA
    FARIAS, MH
    COTAARAIZA, L
    GALVAN, DH
    ASOMOZA, R
    VIDAL, MA
    QUINTERO, R
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1989, 7 (04): : 2625 - 2627
12345