首页
学术期刊
论文检测
AIGC检测
热点
更多
数据
ION-INDUCED AUGER-ELECTRON SPECTROSCOPY - NEW DETECTION METHOD FOR COMPOSITIONAL HOMOGENEITIES OF ALLOYED ATOMS IN SILICON
被引:1
|
作者
:
HIRAKI, A
论文数:
0
引用数:
0
h-index:
0
HIRAKI, A
IMURA, T
论文数:
0
引用数:
0
h-index:
0
IMURA, T
IWAMI, M
论文数:
0
引用数:
0
h-index:
0
IWAMI, M
KIM, SC
论文数:
0
引用数:
0
h-index:
0
KIM, SC
USHITA, K
论文数:
0
引用数:
0
h-index:
0
USHITA, K
OKAMOTO, H
论文数:
0
引用数:
0
h-index:
0
OKAMOTO, H
HAMAKAWA, Y
论文数:
0
引用数:
0
h-index:
0
HAMAKAWA, Y
机构
:
来源
:
SOLAR ENERGY MATERIALS
|
1979年
/ 2卷
/ 01期
关键词
:
D O I
:
10.1016/0165-1633(79)90035-2
中图分类号
:
TE [石油、天然气工业];
TK [能源与动力工程];
学科分类号
:
0807 ;
0820 ;
摘要
:
引用
收藏
页码:125 / 130
页数:6
相关论文
共 49 条
[41]
AUGER-ELECTRON AND X-RAY PHOTOELECTRON-SPECTROSCOPY ANALYSIS OF THE HYDROGENATED AMORPHOUS SILICON-TIN OXIDE INTERFACE - EVIDENCE OF A PLASMA-INDUCED REACTION
THOMAS, JH
论文数:
0
引用数:
0
h-index:
0
THOMAS, JH
CATALANO, A
论文数:
0
引用数:
0
h-index:
0
CATALANO, A
APPLIED PHYSICS LETTERS,
1983,
43
(01)
: 101
-
102
[42]
ION-INDUCED ATOMIC-LIKE LMM AND L2MM AUGER-ELECTRON EMISSION FROM MG, AL, SI, AND MGXAL1-X - ROLE OF SYMMETRICAL AND ASYMMETRIC COLLISIONS
XU, F
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV CALABRIA,DIPARTIMENTO CHIM,I-87036 RENDE,ITALY
UNIV CALABRIA,DIPARTIMENTO CHIM,I-87036 RENDE,ITALY
XU, F
ASCIONE, F
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV CALABRIA,DIPARTIMENTO CHIM,I-87036 RENDE,ITALY
UNIV CALABRIA,DIPARTIMENTO CHIM,I-87036 RENDE,ITALY
ASCIONE, F
MANDARINO, N
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV CALABRIA,DIPARTIMENTO CHIM,I-87036 RENDE,ITALY
UNIV CALABRIA,DIPARTIMENTO CHIM,I-87036 RENDE,ITALY
MANDARINO, N
ZOCCALI, P
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV CALABRIA,DIPARTIMENTO CHIM,I-87036 RENDE,ITALY
UNIV CALABRIA,DIPARTIMENTO CHIM,I-87036 RENDE,ITALY
ZOCCALI, P
CALAMINICI, P
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV CALABRIA,DIPARTIMENTO CHIM,I-87036 RENDE,ITALY
UNIV CALABRIA,DIPARTIMENTO CHIM,I-87036 RENDE,ITALY
CALAMINICI, P
OLIVA, A
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV CALABRIA,DIPARTIMENTO CHIM,I-87036 RENDE,ITALY
UNIV CALABRIA,DIPARTIMENTO CHIM,I-87036 RENDE,ITALY
OLIVA, A
论文数:
引用数:
h-index:
机构:
BONANNO, A
RUSSO, N
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV CALABRIA,DIPARTIMENTO CHIM,I-87036 RENDE,ITALY
UNIV CALABRIA,DIPARTIMENTO CHIM,I-87036 RENDE,ITALY
RUSSO, N
PHYSICAL REVIEW B,
1993,
48
(14):
: 9987
-
9994
[43]
IN-SITU AUGER-ELECTRON SPECTROSCOPY OF SILICON THIN-FILMS FABRICATED USING ARF EXCIMER LASER-INDUCED CHEMICAL-VAPOR-DEPOSITION AND THE OXIDATION PROCESS
MUTOH, K
论文数:
0
引用数:
0
h-index:
0
机构:
Matsushita Research Institute Tokyo, Inc., Tama-ku, Kawasaki, 214
MUTOH, K
TAKEYAMA, S
论文数:
0
引用数:
0
h-index:
0
机构:
Matsushita Research Institute Tokyo, Inc., Tama-ku, Kawasaki, 214
TAKEYAMA, S
YAMADA, Y
论文数:
0
引用数:
0
h-index:
0
机构:
Matsushita Research Institute Tokyo, Inc., Tama-ku, Kawasaki, 214
YAMADA, Y
MIYATA, T
论文数:
0
引用数:
0
h-index:
0
机构:
Matsushita Research Institute Tokyo, Inc., Tama-ku, Kawasaki, 214
MIYATA, T
APPLIED SURFACE SCIENCE,
1994,
79-80
(1-4)
: 459
-
464
[44]
Ion-induced electron emission as a means of studying energy- and angle-dependent compositional changes of solids bombarded with reactive ions - I. Oxygen bombardment of silicon
Wittmaack, K
论文数:
0
引用数:
0
h-index:
0
机构:
GSF Forschungszentrum Umwelt & Gesundheit GMBH, Inst Strahlenschutz, D-85758 Neuherberg, Germany
GSF Forschungszentrum Umwelt & Gesundheit GMBH, Inst Strahlenschutz, D-85758 Neuherberg, Germany
Wittmaack, K
SURFACE SCIENCE,
1999,
419
(2-3)
: 249
-
264
[45]
Study of ion desorption induced by a resonant core-level excitation of condensed NH3 using Auger-electron photo-ion coincidence (AEPICO) spectroscopy combined with synchrotron radiation
Nagasono, M
论文数:
0
引用数:
0
h-index:
0
机构:
Institute for Molecular Science, Okazaki 444, Myodaiji-cho
Nagasono, M
Mase, K
论文数:
0
引用数:
0
h-index:
0
机构:
Institute for Molecular Science, Okazaki 444, Myodaiji-cho
Mase, K
Tanaka, S
论文数:
0
引用数:
0
h-index:
0
机构:
Institute for Molecular Science, Okazaki 444, Myodaiji-cho
Tanaka, S
Urisu, T
论文数:
0
引用数:
0
h-index:
0
机构:
Institute for Molecular Science, Okazaki 444, Myodaiji-cho
Urisu, T
SURFACE SCIENCE,
1997,
390
(1-3)
: 102
-
106
[46]
Ion-induced electron emission as a means of studying energy- and angle-dependent compositional changes of solids bombarded with reactive ions - II. Nitrogen bombardment of silicon
Kataoka, Y
论文数:
0
引用数:
0
h-index:
0
机构:
GSF Forschungszentrum Umwelt & Gesundheit, Inst Strahlenschutz, D-85758 Neuherberg, Germany
GSF Forschungszentrum Umwelt & Gesundheit, Inst Strahlenschutz, D-85758 Neuherberg, Germany
Kataoka, Y
Wittmaack, K
论文数:
0
引用数:
0
h-index:
0
机构:
GSF Forschungszentrum Umwelt & Gesundheit, Inst Strahlenschutz, D-85758 Neuherberg, Germany
GSF Forschungszentrum Umwelt & Gesundheit, Inst Strahlenschutz, D-85758 Neuherberg, Germany
Wittmaack, K
SURFACE SCIENCE,
1999,
424
(2-3)
: 299
-
310
[47]
Ion-induced electron emission as a means of studying energy- and angle-dependent compositional changes of solids bombarded with reactive ions. I. Oxygen bombardment of silicon
GSF-Forschungszentrum fuer Umwelt, und Gesundheit, Neuherberg, Germany
论文数:
0
引用数:
0
h-index:
0
GSF-Forschungszentrum fuer Umwelt, und Gesundheit, Neuherberg, Germany
Surf Sci,
2-3
(249-264):
[48]
ION-BOMBARDMENT INDUCED SILICIDE FORMATION DURING SPUTTER DEPTH PROFILING OF TA/SI MULTILAYER THIN-FILM STRUCTURE AS STUDIED BY X-RAY PHOTOELECTRON-SPECTROSCOPY AND AUGER-ELECTRON SPECTROSCOPY
CHAKRABORTY, BR
论文数:
0
引用数:
0
h-index:
0
机构:
Max-Planck-Institut für Metallforschung, Institut für Werkstoffwissenschaft, W-7000 Stuttgart 1
CHAKRABORTY, BR
HOFMANN, S
论文数:
0
引用数:
0
h-index:
0
机构:
Max-Planck-Institut für Metallforschung, Institut für Werkstoffwissenschaft, W-7000 Stuttgart 1
HOFMANN, S
THIN SOLID FILMS,
1991,
204
(01)
: 163
-
174
[49]
CHARACTERIZATION OF SURFACTANT INTRODUCTION INTO GERMANIUM-RICH SI1-XGEX MOLECULAR-BEAM EPITAXY LAYER GROWTH ON SILICON BY MEANS OF SECONDARY-ION MASS-SPECTROMETRY AND AUGER-ELECTRON SPECTROSCOPY
KRUEGER, D
论文数:
0
引用数:
0
h-index:
0
机构:
MTG MBH,HALBLEITERWERK FRANKFURT ODER,O-1201 FRANKFURT,GERMANY
MTG MBH,HALBLEITERWERK FRANKFURT ODER,O-1201 FRANKFURT,GERMANY
KRUEGER, D
KURPS, R
论文数:
0
引用数:
0
h-index:
0
机构:
MTG MBH,HALBLEITERWERK FRANKFURT ODER,O-1201 FRANKFURT,GERMANY
MTG MBH,HALBLEITERWERK FRANKFURT ODER,O-1201 FRANKFURT,GERMANY
KURPS, R
OSTEN, HJ
论文数:
0
引用数:
0
h-index:
0
机构:
MTG MBH,HALBLEITERWERK FRANKFURT ODER,O-1201 FRANKFURT,GERMANY
MTG MBH,HALBLEITERWERK FRANKFURT ODER,O-1201 FRANKFURT,GERMANY
OSTEN, HJ
LIPPERT, G
论文数:
0
引用数:
0
h-index:
0
机构:
MTG MBH,HALBLEITERWERK FRANKFURT ODER,O-1201 FRANKFURT,GERMANY
MTG MBH,HALBLEITERWERK FRANKFURT ODER,O-1201 FRANKFURT,GERMANY
LIPPERT, G
ROESER, D
论文数:
0
引用数:
0
h-index:
0
机构:
MTG MBH,HALBLEITERWERK FRANKFURT ODER,O-1201 FRANKFURT,GERMANY
MTG MBH,HALBLEITERWERK FRANKFURT ODER,O-1201 FRANKFURT,GERMANY
ROESER, D
THIN SOLID FILMS,
1992,
221
(1-2)
: 61
-
64
←
1
2
3
4
5
→