SOME STRAIGHTFORWARD GUIDELINES HELP IMPROVE BOARD TESTABILITY

被引:0
|
作者
DAVIDSON, RP
机构
来源
EDN MAGAZINE-ELECTRICAL DESIGN NEWS | 1979年 / 24卷 / 09期
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:127 / 129
页数:3
相关论文
共 50 条
  • [1] GUIDELINES CAN HELP IMPROVE DISTILLATION OPERATIONS
    SHAH, GC
    [J]. OIL & GAS JOURNAL, 1978, 76 (39) : 102 - 106
  • [2] GUIDELINES HELP IMPROVE PLANT ELECTRICAL SYSTEM RELIABILITY
    MORRISON, WG
    [J]. OIL & GAS JOURNAL, 1978, 76 (23) : 148 - &
  • [3] TESTABILITY GUIDELINES FOR MULTICHIP MODULES
    POSSE, KE
    [J]. MICROPROCESSORS AND MICROSYSTEMS, 1993, 17 (05) : 281 - 287
  • [4] Breaking correlation to improve testability
    Ockunzzi, K
    Papachristou, C
    [J]. 19TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS, 2001, : 75 - 80
  • [5] BASIC GUIDELINES SIMPLIFY DESIGNING FOR TESTABILITY
    COOPER, C
    [J]. COMPUTER DESIGN, 1985, 24 (13): : 77 - &
  • [6] Design and fixturing techniques to improve testability
    DAquila, L
    [J]. EE-EVALUATION ENGINEERING, 1996, 35 (08): : 40 - &
  • [7] Straightforward estimations of GNSS on-board clocks
    Delporte, Jerome
    Boulanger, Cyrille
    Mercier, Flavien
    [J]. 2011 JOINT CONFERENCE OF THE IEEE INTERNATIONAL FREQUENCY CONTROL SYMPOSIUM/EUROPEAN FREQUENCY AND TIME FORUM PROCEEDINGS, 2011, : 841 - 844
  • [8] TESTABILITY GUIDELINES AID CIRCUIT-DESIGN
    DESENA, A
    [J]. COMPUTER DESIGN, 1988, 27 (02): : 106 - 107
  • [9] MCM structures with poled dielectrics to improve testability
    Mechtel, DM
    Charles, HK
    Francomacaro, AS
    [J]. 48TH ELECTRONIC COMPONENTS & TECHNOLOGY CONFERENCE - 1998 PROCEEDINGS, 1998, : 1286 - 1290
  • [10] Knowledge base to manage the grading and selection of testability guidelines
    Ungar, Louis Y.
    Parameswaran, Rajini
    [J]. AUTOTESTCON 2005, 2005, : 444 - 450