SURFACE ALLOYING AT THE SN-PT(111) INTERFACE - A STUDY BY X-RAY PHOTOELECTRON DIFFRACTION

被引：54

作者：

GALEOTTI, M ^{[1
]}

ATREI, A ^{[1
]}

BARDI, U ^{[1
]}

ROVIDA, G ^{[1
]}

TORRINI, M ^{[1
]}

机构：

[1] UNIV FIRENZE,DIPARTIMENTO CHIM,I-50129 FLORENCE,ITALY

来源：

SURFACE SCIENCE | 1994年 / 313卷 / 03期

关键词：

D O I：

10.1016/0039-6028(94)90055-8

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

The formation of surface alloys obtained by annealing ultrathin films of Sn deposited on the Pt(111) surface was investigated by low energy electron diffraction and X-ray photoelectron diffraction. The Pt(111)(2 x 2)-Sn and Pt(111)(square-root 3 x square-root 3)R30-degrees-Sn form after deposition of amounts of Sn in the range from 0.2 to 1 ML and subsequent annealing at 1000 K are found by XPD to be single atomic layer surface alloys. Depositing 4-5 ML of Sn and annealing at 400-600 K produces an ordered phase exhibiting a (2 x 2) LEED pattern. This phase is a multilayer surface alloy and it has the same structure as the bulk Pt3Sn alloy. .

引用

页码：349 / 354

页数：6

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