Highly angular resolved x-ray photoelectron diffraction Ge(111) measurements from a Ge(111) surface

Using a high angle-resolving electron energy analyser with a novel input lens system, we measured Ge 3p x-ray photoelectron diffraction (XPED) patterns from a Ge(111) surface excited by Al Kalpha with changing angular resolution from +/-0.04degrees to +/-2degrees. and considered the angular resolution dependence of XPED patterns from experiments and theory. Highly angular resolved XPED patterns containing fine features such as Kikuchi-like bands were obtained. These patterns were reproduced by theoretical calculations. We also performed the theoretical calculations for further investigation of highly angular resolved XPED. Copyright (C) 2004 John Wiley Sons, Ltd.