COST-BENEFIT-ANALYSIS OF A ONE-SERVER 2-UNIT SYSTEM SUBJECT TO SHOCK AND DEGRADATION

被引：1
|
作者：
GOPALAN, MN
RAMESH, TK
机构：
来源：
MICROELECTRONICS AND RELIABILITY | 1986年 / 26卷 / 03期
关键词：
D O I：
10.1016/0026-2714(86)90298-2
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：499 / 518
页数：20
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