COST-BENEFIT-ANALYSIS OF A ONE-SERVER 2-UNIT SYSTEM SUBJECT TO SHOCK AND DEGRADATION

被引：1

|

作者：

GOPALAN, MN

RAMESH, TK

机构：

来源：

MICROELECTRONICS AND RELIABILITY | 1986年 / 26卷 / 03期

关键词：

D O I：

10.1016/0026-2714(86)90298-2

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

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页码：499 / 518

页数：20

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