A DISCUSSION OF ALL-OR-NONE INSPECTION POLICIES

被引:18
|
作者
VANDERWIEL, SA
VARDEMAN, SB
机构
[1] IOWA STATE UNIV,DEPT STAT,AMES,IA 50011
[2] IOWA STATE UNIV,DEPT IND & MFG SYST ENGN,AMES,IA 50011
[3] IOWA STATE UNIV,CTR NONDESTRUCT EVALUAT,AMES,IA 50011
关键词
ACCEPTANCE SAMPLING; COST OPTIMALITY; IMPERFECT INSPECTION; SEQUENTIAL DECISION MAKING;
D O I
10.2307/1269203
中图分类号
O21 [概率论与数理统计]; C8 [统计学];
学科分类号
020208 ; 070103 ; 0714 ;
摘要
An optimal inspection policy will inspect either every item produced or no item when (a) product characteristics are well modeled as lid and (b) overall inspection cost is a sum of individually and identically determined costs for each of the items encountered. This result is widely known for special cases such as lid Bernoulli product characteristics with single-sample lot acceptance-sampling plans. We show that the result holds true much more generally and over a much wider class of inspection plans, even when independent inspection errors are possible. We examine the assumptions that lead to all-or-none optimality and discuss the practical meaning of all-or-none results to practitioners. Examples are given to demonstrate that both ''other'' cost structures and ''informative'' inspections (i.e., lack of independence) can lead to optimal policies that are not of the all-or-none type.
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页码:102 / 109
页数:8
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