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PREFERENTIAL SPUTTERING OF LIF SURFACES MONITORED BY PHOTOELECTRON-SPECTROSCOPY AND DIRECT RECOIL SPECTROMETRY
被引:0
|
作者
:
CHEN, JN
论文数:
0
引用数:
0
h-index:
0
CHEN, JN
RABALAIS, JW
论文数:
0
引用数:
0
h-index:
0
RABALAIS, JW
机构
:
来源
:
SURFACE SCIENCE
|
1986年
/ 176卷
/ 03期
关键词
:
D O I
:
暂无
中图分类号
:
O64 [物理化学(理论化学)、化学物理学];
学科分类号
:
070304 ;
081704 ;
摘要
:
引用
收藏
页码:L879 / L885
页数:7
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