PREFERENTIAL SPUTTERING OF LIF SURFACES MONITORED BY PHOTOELECTRON-SPECTROSCOPY AND DIRECT RECOIL SPECTROMETRY

被引：0
|
作者：
CHEN, JN
RABALAIS, JW
机构：
来源：
SURFACE SCIENCE | 1986年 / 176卷 / 03期
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D O I：
暂无
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
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页码：L879 / L885
页数：7
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