PREFERENTIAL SPUTTERING OF LIF SURFACES MONITORED BY PHOTOELECTRON-SPECTROSCOPY AND DIRECT RECOIL SPECTROMETRY

被引：0

作者：

CHEN, JN

RABALAIS, JW

机构：

来源：

SURFACE SCIENCE | 1986年 / 176卷 / 03期

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D O I：

暂无

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：L879 / L885

页数：7

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