SCANNING TUNNELING MICROSCOPE (STM) FOR CONVENTIONAL TRANSMISSION ELECTRON-MICROSCOPE (TEM)

被引：0
|
作者：
IWATSUKI, M [1 ]
MUROOKA, K [1 ]
KITAMURA, S [1 ]
TAKAYANAGI, K [1 ]
HARADA, Y [1 ]
机构：
[1] TOKYO INST TECHNOL,MIDORI KU,YOKOHAMA,KANAGAWA 227,JAPAN
来源：
JOURNAL OF ELECTRON MICROSCOPY | 1991年 / 40卷 / 01期
关键词：
SCANNING TUNNELING MICROSCOPE (STM); UHM-TEM; PIEZOELECTRIC SCANNER; REM; STM-REM HOLDER;
D O I：
暂无
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
In order to identify an observation area with a scanning tunneling microscope (STM) and a particular area of the specimen, we developed a holder-type STM for an ultrahigh vacuum transmission electron microscope (UHV-TEM), operating in a reflection electron microscopy mode (REM). This instrument has been improved in the dynamic range of the observation area and the piezoelectric scanner provides a high mechanical resonance frequency of 160 kHz.
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页码：48 / 53
页数：6
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