SCANNING TUNNELING MICROSCOPE (STM) FOR CONVENTIONAL TRANSMISSION ELECTRON-MICROSCOPE (TEM)

被引：0

作者：

IWATSUKI, M ^{[1
]}

MUROOKA, K ^{[1
]}

KITAMURA, S ^{[1
]}

TAKAYANAGI, K ^{[1
]}

HARADA, Y ^{[1
]}

机构：

[1] TOKYO INST TECHNOL,MIDORI KU,YOKOHAMA,KANAGAWA 227,JAPAN

来源：

JOURNAL OF ELECTRON MICROSCOPY | 1991年 / 40卷 / 01期

关键词：

SCANNING TUNNELING MICROSCOPE (STM); UHM-TEM; PIEZOELECTRIC SCANNER; REM; STM-REM HOLDER;

D O I：

暂无

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

In order to identify an observation area with a scanning tunneling microscope (STM) and a particular area of the specimen, we developed a holder-type STM for an ultrahigh vacuum transmission electron microscope (UHV-TEM), operating in a reflection electron microscopy mode (REM). This instrument has been improved in the dynamic range of the observation area and the piezoelectric scanner provides a high mechanical resonance frequency of 160 kHz.

引用

页码：48 / 53

页数：6

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