XPS MEASUREMENTS OF ABRUPT GE-GAAS HETEROJUNCTION INTERFACES

被引：45
|
作者：
GRANT, RW
WALDROP, JR
KRAUT, EA
机构：
来源：
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY | 1978年 / 15卷 / 04期
关键词：
D O I：
10.1116/1.569806
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页码：1451 / 1455
页数：5
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