The primary and secondary picture of the electron microscope.

被引:0
|
作者
Boersch, H
机构
关键词
D O I
暂无
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
引用
收藏
页码:75 / 80
页数:6
相关论文
共 50 条
  • [31] STUDYING BONE REGENERATION WITH THE SCANNING ELECTRON MICROSCOPE.
    Draenert, K.
    Scanning Electron Microscopy, 1983, v (pt 1) : 247 - 254
  • [32] AUTOMATED FIBER COUNTING IN THE SCANNING ELECTRON MICROSCOPE.
    Stott, W.R.
    Meranger, J.C.
    Scanning Electron Microscopy, 1984, v : 583 - 588
  • [33] IN SITU FRACTURE TESTS IN THE SCANNING ELECTRON MICROSCOPE.
    Roulin-Moloney, A.C.
    Cudre-Mauroux, N.
    Kausch, H.H.
    Polymer Composites, 1986, 8 (05) : 324 - 330
  • [34] Fault Analysis of Semiconductors with the Scanning Electron Microscope.
    Schaefer, Wolfgang
    Niederauer, Klaus
    1600, (34):
  • [35] Investigation of the Porosity of Sandstones by Scanning Electron Microscope.
    Gaida, Karl Heinz
    Ruehl, Walter
    Zimmerle, Winfried
    Erdoel-Erdgas-Zeitschrift, 1973, 89 (09): : 336 - 343
  • [36] Schizosaccharomyces japonicus through scanning electron microscope.
    Benevelli, M
    Zambonelli, C
    Papa, F
    Grazia, L
    ANNALI DI MICROBIOLOGIA ED ENZIMOLOGIA, 1996, 46 : 29 - 38
  • [37] Charging identification and compensation in the scanning electron microscope.
    Wong, WK
    Thong, JTL
    Phang, JCH
    PROCEEDINGS OF THE 1997 6TH INTERNATIONAL SYMPOSIUM ON THE PHYSICAL & FAILURE ANALYSIS OF INTEGRATED CIRCUITS, 1997, : 97 - 102
  • [38] Comments on the greatness of the chromatic error in the electron microscope.
    von Ardenne, Manfred
    ZEITSCHRIFT FUR PHYSIK, 1939, 113 (3-4): : 257 - 259
  • [39] High Resolution Scanning Transmission Electron Microscope.
    Mueller, Karl Heinz
    Krisch, Burkhard
    1600, : 76 - 57
  • [40] MEASUREMENT OF SHORT LENGTHS WITH A SCANNING ELECTRON MICROSCOPE.
    Bogdankevich, O.V.
    Zhelkobaev, Zh.
    Kalendin, V.V.
    Kudeyarov, Yu.A.
    Nevsorova, L.N.
    Measurement Techniques, 1985, 28 (11) : 957 - 961