The primary and secondary picture of the electron microscope.

被引：0

作者：

Boersch, H

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中图分类号：

O4 [物理学];

学科分类号：

0702 ;

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引用

页码：75 / 80

页数：6

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[21] TO THE THEORETICAL RESOLUTION LIMIT OF THE ELECTRON MICROSCOPE.
Frank, Ludek
Optik (Jena), 1974, 41 (03): : 245 - 255
[22] Lines of the same thickness in the electron microscope.
Kossel, W
NATURWISSENSCHAFTEN, 1943, 31 : 323 - 324
[23] The figure Penetrated films in the electron microscope.
v Borries, Bodo
Ruska, Ernst
ZEITSCHRIFT FUR PHYSIK, 1933, 83 (3-4): : 187 - 193
[24] Testing of an Improved Corrected Electron Microscope.
Hely, H.
Optik (Jena), 1982, 60 (04): : 353 - 370
[25] Testings on catalysators with the universal electron microscope.
von Ardenne, M
Beischer, D
ANGEWANDTE CHEMIE, 1940, 53 : 0103 - 0107
[26] Overuse of stereomicroscopy with the universal electron microscope.
von Ardenne, M
NATURWISSENSCHAFTEN, 1940, 28 : 248 - 252
[27] SPUTTERING IN THE HIGH VOLTAGE ELECTRON MICROSCOPE.
Cherns, D.
Minter, F.J.
Nelson, R.S.
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[28] Image error theory of the electron microscope.
Glaser, Walter
ZEITSCHRIFT FUR PHYSIK, 1935, 97 (3-4): : 177 - 201
[29] Measurements of spatial objects with an electron microscope.
Gotthardt, E.
ZEITSCHRIFT FUR PHYSIK, 1941, 118 (11-12): : 714 - 717
[30] The taxonomic identification of fungi with the scanning electron microscope.
Gomez, AJ
Pinero, JLH
ELECTRON MICROSCOPY 1998, VOL 4: BIOLOGICAL SCIENCES, 1998, : 97 - 98