IMAGE-CONTRAST ENHANCEMENT USING SIGNAL-PROCESSING AND DARK FIELD TECHNIQUES IN SCANNING ELECTRON-MICROSCOPY

被引：0
|
作者：
INOUE, M
KOKUBO, Y
AITA, S
HOSOI, J
机构：
[1] JEOL LTD,1418 NAKAGAMI,AKISHIMA,TOKYO 196,JAPAN
[2] JEOL USA INC,11 DEARBORN RD,PEABODY,MA 01960
来源：
JOURNAL OF ELECTRON MICROSCOPY | 1980年 / 29卷 / 03期
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D O I：
暂无
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
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页码：320 / 320
页数：1
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