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- [1] SCANNING ELECTRON-MICROSCOPY - USE OF BACKSCATTERED ELECTRON IMAGE IN MATERIALS INVESTIGATIONSJOURNAL OF THE AUSTRALASIAN INSTITUTE OF METALS, 1976, 21 (04): : 178 - 182KISS, LTBRINKIES, HG
- [2] BIOLOGICAL APPLICATIONS OF BACKSCATTERED ELECTRON IMAGING OF SCANNING ELECTRON-MICROSCOPYSCANNING, 1987, 9 (03) : 95 - 98SOLIGO, DLAMBERTENGHIDELILIERS, G
- [4] CONSTRUCTION AND USES OF AN EFFICIENT BACKSCATTERED ELECTRON DETECTOR FOR SCANNING ELECTRON-MICROSCOPYJOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1974, 7 (08): : 650 - 652ROBINSON, VN
- [5] SCANNING ELECTRON-MICROSCOPY WITH BACKSCATTERED ELECTRON IMAGING TO IDENTIFY PNEUMOCYSTIS-CARINIINEW ENGLAND JOURNAL OF MEDICINE, 1987, 317 (24): : 1541 - 1541SCHRAUFNAGEL, DEBECKER, RPBALAAN, MSCHMID, ACLAYPOOL, W
- [6] ANALYSIS OF MATERIALS USING SCANNING AND TRANSMISSION ELECTRON-MICROSCOPYABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1991, 202 : 14 - INORKRIVEN, WM
- [7] SCANNING ELECTRON-MICROSCOPY OF HEPATIC ULTRASTRUCTURE - SECONDARY, BACKSCATTERED, AND TRANSMITTED ELECTRON IMAGINGLABORATORY INVESTIGATION, 1976, 35 (04) : 369 - 376MIYAI, KABRAHAM, JLLINTHICUM, DSWAGNER, RM
- [8] COMPARISON OF BACKSCATTERED SCANNING ELECTRON-MICROSCOPY AND MICRORADIOGRAPHY OF SECONDARY CARIESSCANNING MICROSCOPY, 1989, 3 (04) : 1043 - 1050MARSHALL, GWSTANINEC, MTORII, YMARSHALL, SJ
- [9] SEMICONDUCTOR CHARACTERIZATION BY SCANNING ELECTRON-MICROSCOPYULTRAMICROSCOPY, 1982, 9 (04) : 395 - 396LEDEBO, LA
- [10] ORIGINS OF SECONDARY-ELECTRON SIGNAL IN SCANNING ELECTRON-MICROSCOPYJOURNAL OF PHYSICS D-APPLIED PHYSICS, 1974, 7 (16) : 2169 - 2173ROBINSON, VN