ANALYSIS OF FAULT-DETECTION PROBABILITY OF RANDOM-ACCESS MEMORIES IN APPLYING RANDOM PATTERNS

被引：0

作者：

TAMAMOTO, H

OHTAKA, T

NARITA, Y

机构：

来源：

IEICE TRANSACTIONS ON COMMUNICATIONS ELECTRONICS INFORMATION AND SYSTEMS | 1991年 / 74卷 / 11期

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We considered the random testing for memories, such that addresses are randomly generated but every cell is evenly accessed, and analyzed the fault detection probability. As the result, the random testing turned out to be an effective testing method for the BIST of embedded memories.

引用

页码：3910 / 3915

页数：6

共 50 条

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